Test the temperature stress of the test piece under the condition of rapid temperature change or gradual change. It is suitable for the adaptability test of the whole machine and parts of electronic and electrical products under the condition of rapid temperature change or gradual change, especially for the Environmental Stress Screening (ESS) test of electronic and electrical products, using the temperature acceleration technique to change the external environmental stress, Thermally stresses and strains the product.

Product alias: small rapid temperature change test chamber, small high and low temperature rapid temperature change chamber, small rapid temperature cycle chamber, small temperature cycle test chamber, small temperature rapid change test chamber, etc.

◎ Reasonable structural design, optimized freezing design.

◎ Wind speed frequency conversion adjustment, fast heating and cooling speed.

◎ High control precision, temperature fluctuation ≤±0.5℃, temperature deviation better than ±1.5℃.

◎ Meet the stress screening of electronic equipment products MIL-STD-2164, MIL-344A-4-14, MIL-2164A-19, NABMAT-9492, GJB-1032-90, GJB/Z34-516, IPC-9701...etc. Require.